HI-REL STX SCREENING

      

Semitronics is a MIL-PRF-19500 Certified Manufacturer

Our Hi-Rel Devices are available tested to the Standard MIL / STX / STXV / STS flows described below or to your custom requirements using industry standard tests and quality assurance standards. 

  HI- RELIABILITY SCREENING PROGRAM

TEST DESCRIPTION

QUALITY ASSURANCE LEVELS

STX

STXV

STS

INTERNAL VISUAL (PRE-CAP) INSPECTION

 

 

 

TEMPERATURE CYCLING  (Method 1051
Condition G 10 Cycles)

 

 

 

CONSTANT ACCELERATION 1/ (Method 2006
10K Gs Y1 Axis only)

 

 

 

PARTICLE IMPACT NOISE DETECTION (PIND)

 

 

 

SERIALIZATION

 

 

 

PRE BURN-IN ELECTRICAL TEST

 

 

 

HIGH TEMPERATURE REVERSE BIAS
(BURN-IN)
Transistors = Method 1039 Condition A
FETS = Method 1042 Condition A
Diodes = Method 1038 Condition A
SCRs = Method 1040
 

 

 

 

FINAL ELECTRICAL PARAMETER (DC-100%)

 

 

 

HERMETIC SEAL (FINE & GROSS LEAK)  2/
(Method 1071)

 

 

 

RADIOGRAPHY

 

 

 

GROUP A (Static parameters @ 25C)

 

        

        

GROUP B SOLDERABILITY /3 (Method 2026)

 

        

        

GROUP B RESISTANCE TO SOLVENTS
(Method 1022)

 

        

      

1/  Performed on Wire Bond Devices

2/  Performed For Cavity Devices

3/  For Case Mounted Only

 

 

 

 

 

 

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